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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Taschenbuch von Mohammed Ismail (u. a.)
Sprache: Englisch

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Beschreibung
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Zusammenfassung

Applies Built-in-Self-Test (Bi. ST) and Built-in-Self-Calibration (Bi.

SC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the outset Reduces significantly high volume test costs of RF and mm.

Inhaltsverzeichnis

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.

Details
Erscheinungsjahr: 2011
Fachbereich: Nachrichtentechnik
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Inhalt: xvii
89 S.
70 s/w Illustr.
89 p. 70 illus.
ISBN-13: 9781441995476
ISBN-10: 1441995471
Sprache: Englisch
Einband: Kartoniert / Broschiert
Autor: Ismail, Mohammed
Bou-Sleiman, Sleiman
Hersteller: Springer US
Springer New York
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 235 x 155 x 7 mm
Von/Mit: Mohammed Ismail (u. a.)
Erscheinungsdatum: 22.09.2011
Gewicht: 0,178 kg
Artikel-ID: 106770246
Zusammenfassung

Applies Built-in-Self-Test (Bi. ST) and Built-in-Self-Calibration (Bi.

SC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the outset Reduces significantly high volume test costs of RF and mm.

Inhaltsverzeichnis

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.

Details
Erscheinungsjahr: 2011
Fachbereich: Nachrichtentechnik
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Inhalt: xvii
89 S.
70 s/w Illustr.
89 p. 70 illus.
ISBN-13: 9781441995476
ISBN-10: 1441995471
Sprache: Englisch
Einband: Kartoniert / Broschiert
Autor: Ismail, Mohammed
Bou-Sleiman, Sleiman
Hersteller: Springer US
Springer New York
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 235 x 155 x 7 mm
Von/Mit: Mohammed Ismail (u. a.)
Erscheinungsdatum: 22.09.2011
Gewicht: 0,178 kg
Artikel-ID: 106770246
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