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CMOS Cantilever Sensor Systems
Atomic Force Microscopy and Gas Sensing Applications
Buch von D. Lange (u. a.)
Sprache: Englisch

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Beschreibung
This book is intended for scientists and engineers in the field of micro- and nano­ electro-mechanical systems (MEMS and NEMS) and introduces the development of cantilever-based sensor systems using CMOS-compatible micromachining from the design concepts and simulations to the prototype. It is also a useful resource for researchers on cantilever sensors and resonant sensors in general The reader will become familiar with the potential of the combination of two technological approaches: IC fabrication technology, notably CMOS technology, and silicon micromachining and the resulting microstructures such as cantilever beams. It was recognized early that these two technologies should be merged in order to make the microstructures smart and devise integrated microsystems with on-chip driving and signal conditioning circuitry - now known as CMOS MEMS or, with the arrival of nanostructures, CMOS NEMS. One way to achieve the merger is the post-processing micro- or nano- machining of finished CMOS wafers, some of which is described in this book. The book introduces this approach based on work carried out at the Physical Electronics Laboratory of ETH Zurich on arrays of cantilever transducers with on-chip driving and signal conditioning circuitry. These cantilevers are familiar from Scanning Probe Microscopy (SPM) and allow the sensitive detection of phys­ ical quantities such as forces and mass changes. The book is divided into three parts. First, general aspects of cantilever resona­ tors are introduced, e. g. their resonant behavior and possible driving and sensing mechanisms.
This book is intended for scientists and engineers in the field of micro- and nano­ electro-mechanical systems (MEMS and NEMS) and introduces the development of cantilever-based sensor systems using CMOS-compatible micromachining from the design concepts and simulations to the prototype. It is also a useful resource for researchers on cantilever sensors and resonant sensors in general The reader will become familiar with the potential of the combination of two technological approaches: IC fabrication technology, notably CMOS technology, and silicon micromachining and the resulting microstructures such as cantilever beams. It was recognized early that these two technologies should be merged in order to make the microstructures smart and devise integrated microsystems with on-chip driving and signal conditioning circuitry - now known as CMOS MEMS or, with the arrival of nanostructures, CMOS NEMS. One way to achieve the merger is the post-processing micro- or nano- machining of finished CMOS wafers, some of which is described in this book. The book introduces this approach based on work carried out at the Physical Electronics Laboratory of ETH Zurich on arrays of cantilever transducers with on-chip driving and signal conditioning circuitry. These cantilevers are familiar from Scanning Probe Microscopy (SPM) and allow the sensitive detection of phys­ ical quantities such as forces and mass changes. The book is divided into three parts. First, general aspects of cantilever resona­ tors are introduced, e. g. their resonant behavior and possible driving and sensing mechanisms.
Zusammenfassung

This book describes a vital measuring principle for analysing integrated circuits with a nano-electro-mechanical system

Includes supplementary material: [...]

Inhaltsverzeichnis
1. Introduction.- 2. Design Considerations.- 3. Cantilever Beam Resonators.- 4. Resonant Gas Sensor.- 5. Force Sensors for Parallel Scanning Atomic Force Microscopy.- 6. Conclusions and Outlook.- Appendices.- A.1 Process Sequence Resonant Gas Sensor.- A.2 Process Sequence Resonant Gas Sensor (Maskless).- A.3 Process Sequence AFM Sensor Arrays.- A.4 Material Properties of Thin Film Materials.- References.
Details
Erscheinungsjahr: 2002
Fachbereich: Nachrichtentechnik
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Reihe: Microtechnology and MEMS
Inhalt: viii
142 S.
ISBN-13: 9783540431435
ISBN-10: 3540431438
Sprache: Englisch
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Autor: Lange, D.
Baltes, H.
Brand, O.
Hersteller: Springer-Verlag GmbH
Springer Berlin Heidelberg
Microtechnology and MEMS
Maße: 241 x 160 x 14 mm
Von/Mit: D. Lange (u. a.)
Erscheinungsdatum: 23.07.2002
Gewicht: 0,407 kg
Artikel-ID: 103843319
Zusammenfassung

This book describes a vital measuring principle for analysing integrated circuits with a nano-electro-mechanical system

Includes supplementary material: [...]

Inhaltsverzeichnis
1. Introduction.- 2. Design Considerations.- 3. Cantilever Beam Resonators.- 4. Resonant Gas Sensor.- 5. Force Sensors for Parallel Scanning Atomic Force Microscopy.- 6. Conclusions and Outlook.- Appendices.- A.1 Process Sequence Resonant Gas Sensor.- A.2 Process Sequence Resonant Gas Sensor (Maskless).- A.3 Process Sequence AFM Sensor Arrays.- A.4 Material Properties of Thin Film Materials.- References.
Details
Erscheinungsjahr: 2002
Fachbereich: Nachrichtentechnik
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Reihe: Microtechnology and MEMS
Inhalt: viii
142 S.
ISBN-13: 9783540431435
ISBN-10: 3540431438
Sprache: Englisch
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Autor: Lange, D.
Baltes, H.
Brand, O.
Hersteller: Springer-Verlag GmbH
Springer Berlin Heidelberg
Microtechnology and MEMS
Maße: 241 x 160 x 14 mm
Von/Mit: D. Lange (u. a.)
Erscheinungsdatum: 23.07.2002
Gewicht: 0,407 kg
Artikel-ID: 103843319
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