Zum Hauptinhalt springen
Dekorationsartikel gehören nicht zum Leistungsumfang.
CMOS RF Circuit Design for Reliability and Variability
Taschenbuch von Jiann-Shiun Yuan
Sprache: Englisch

53,49 €*

inkl. MwSt.

Versandkostenfrei per Post / DHL

Aktuell nicht verfügbar

Kategorien:
Beschreibung
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
Zusammenfassung

First book to address the effect of device reliability and process variations on the RF circuit performance degradations

Present of all kinds RF circuits in the reliability examination

Includes analytical equations, experimental data and simulation results

Includes supplementary material: [...]

Inhaltsverzeichnis
CMOS Transistor Reliability and Variability.- Wireless Receiver and Transmitter Circuit Reliability.- Low Noise Amplifier Reliability and Variability.- Power Amplifier Reliability and Variability.- Voltage Controlled Oscillator Reliability and Variability.- Mixer Reliability.
Details
Erscheinungsjahr: 2016
Fachbereich: Nachrichtentechnik
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Reihe: SpringerBriefs in Reliability
Inhalt: vi
106 S.
101 s/w Illustr.
106 p. 101 illus.
ISBN-13: 9789811008825
ISBN-10: 9811008825
Sprache: Englisch
Herstellernummer: 978-981-10-0882-5
Ausstattung / Beilage: Paperback
Einband: Kartoniert / Broschiert
Autor: Yuan, Jiann-Shiun
Auflage: 1st ed. 2016
Hersteller: Springer Singapore
Springer Nature Singapore
SpringerBriefs in Reliability
Maße: 235 x 155 x 7 mm
Von/Mit: Jiann-Shiun Yuan
Erscheinungsdatum: 21.04.2016
Gewicht: 0,184 kg
Artikel-ID: 103918885
Zusammenfassung

First book to address the effect of device reliability and process variations on the RF circuit performance degradations

Present of all kinds RF circuits in the reliability examination

Includes analytical equations, experimental data and simulation results

Includes supplementary material: [...]

Inhaltsverzeichnis
CMOS Transistor Reliability and Variability.- Wireless Receiver and Transmitter Circuit Reliability.- Low Noise Amplifier Reliability and Variability.- Power Amplifier Reliability and Variability.- Voltage Controlled Oscillator Reliability and Variability.- Mixer Reliability.
Details
Erscheinungsjahr: 2016
Fachbereich: Nachrichtentechnik
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Reihe: SpringerBriefs in Reliability
Inhalt: vi
106 S.
101 s/w Illustr.
106 p. 101 illus.
ISBN-13: 9789811008825
ISBN-10: 9811008825
Sprache: Englisch
Herstellernummer: 978-981-10-0882-5
Ausstattung / Beilage: Paperback
Einband: Kartoniert / Broschiert
Autor: Yuan, Jiann-Shiun
Auflage: 1st ed. 2016
Hersteller: Springer Singapore
Springer Nature Singapore
SpringerBriefs in Reliability
Maße: 235 x 155 x 7 mm
Von/Mit: Jiann-Shiun Yuan
Erscheinungsdatum: 21.04.2016
Gewicht: 0,184 kg
Artikel-ID: 103918885
Warnhinweis

Ähnliche Produkte

Ähnliche Produkte