Navid Asadi is an assistant professor in the department of electrical and computer engineering at university of Florida. His research is mainly focused on physical inspection of electronics from device to system level. He investigates novel techniques for integrated circuits counterfeit detection/prevention, system and chip level reverse engineering, anti-reverse engineering, invasive and semi-invasive physical attacks, integrity analysis, etc. using advanced inspection methods including but not limited to 3D X-ray microscopy, Optical imaging, scanning electron microscopy (SEM), focused ion beams (FIBs), THz imaging, etc. in combination with image processing and machine learning algorithms to make the inspection process intelligent and independent from human. He has received several best paper awards and is the co-founder of the IEEE-PAINE conference.

1. Materials for Electronics Security: An Overview
2. Electronics counterfeits and materials
3. Terahertz technologies for electronics materials assurance
4. Role of MEMS in Electronics Security
5. Packaging Encapsulant assurance
6. Materials for Track and Trace
7. Naturally Inherent Materials for Electronics assurance
8. Materials for Fingerprinting
9. Emerging materials for Protection mechanisms