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Englisch
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Beschreibung
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Zusammenfassung
Main benefit is information about the physics of image formation and microanalysis in scanning electron microscopy
2nd, completely revised and updated edition
Inhaltsverzeichnis
Electron Optics of a Scanning Electron Microscope.- Electron Scattering and Diffusion.- Emission of Backscattered and Secondary Electrons.- Electron Detectors and Spectrometers.- Image Contrast and Signal Processing.- Electron-Beam-Induced Current and Cathodoluminescence.- Special Techniques in SEM.- Crystal Structure Analysis by Diffraction.- Elemental Analysis and Imaging with X-Rays.
Details
| Erscheinungsjahr: | 1998 |
|---|---|
| Fachbereich: | Nachrichtentechnik |
| Genre: | Mathematik, Medizin, Naturwissenschaften, Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Buch |
| Inhalt: | Einband - fest (Hardcover) |
| ISBN-13: | 9783540639763 |
| ISBN-10: | 3540639764 |
| Sprache: | Englisch |
| Einband: | Gebunden |
| Autor: | Reimer, Ludwig |
| Redaktion: | Hawkes, P.W. |
| Auflage: | 2nd completely revidierte and updated edition 1998 |
| Hersteller: |
Springer-Verlag GmbH
Springer Berlin Heidelberg |
| Verantwortliche Person für die EU: | preigu, Ansas Meyer, Lengericher Landstr. 19, D-49078 Osnabrück, mail@preigu.de |
| Maße: | 241 x 160 x 35 mm |
| Von/Mit: | Ludwig Reimer |
| Erscheinungsdatum: | 17.09.1998 |
| Gewicht: | 0,975 kg |
Zusammenfassung
Main benefit is information about the physics of image formation and microanalysis in scanning electron microscopy
2nd, completely revised and updated edition
Inhaltsverzeichnis
Electron Optics of a Scanning Electron Microscope.- Electron Scattering and Diffusion.- Emission of Backscattered and Secondary Electrons.- Electron Detectors and Spectrometers.- Image Contrast and Signal Processing.- Electron-Beam-Induced Current and Cathodoluminescence.- Special Techniques in SEM.- Crystal Structure Analysis by Diffraction.- Elemental Analysis and Imaging with X-Rays.
Details
| Erscheinungsjahr: | 1998 |
|---|---|
| Fachbereich: | Nachrichtentechnik |
| Genre: | Mathematik, Medizin, Naturwissenschaften, Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Buch |
| Inhalt: | Einband - fest (Hardcover) |
| ISBN-13: | 9783540639763 |
| ISBN-10: | 3540639764 |
| Sprache: | Englisch |
| Einband: | Gebunden |
| Autor: | Reimer, Ludwig |
| Redaktion: | Hawkes, P.W. |
| Auflage: | 2nd completely revidierte and updated edition 1998 |
| Hersteller: |
Springer-Verlag GmbH
Springer Berlin Heidelberg |
| Verantwortliche Person für die EU: | preigu, Ansas Meyer, Lengericher Landstr. 19, D-49078 Osnabrück, mail@preigu.de |
| Maße: | 241 x 160 x 35 mm |
| Von/Mit: | Ludwig Reimer |
| Erscheinungsdatum: | 17.09.1998 |
| Gewicht: | 0,975 kg |
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