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Englisch
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Beschreibung
Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again.
Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again.
Zusammenfassung
This classic monograph again available in a revised and updated
version by the author's successor.
version by the author's successor.
Inhaltsverzeichnis
Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron¿Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ..- Imaging of Crystalline Specimens and Their Defects..- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy..- Specimen Damage by Electron Irradiation.
Details
Erscheinungsjahr: | 2010 |
---|---|
Genre: | Importe, Technik allg. |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Taschenbuch |
Inhalt: |
xvi
590 S. 276 s/w Illustr. 590 p. 276 illus. |
ISBN-13: | 9781441923080 |
ISBN-10: | 144192308X |
Sprache: | Englisch |
Einband: | Kartoniert / Broschiert |
Autor: |
Reimer, Ludwig
Kohl, Helmut |
Auflage: | 5th edition |
Hersteller: |
Springer US
Springer New York |
Verantwortliche Person für die EU: | Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com |
Maße: | 236 x 154 x 35 mm |
Von/Mit: | Ludwig Reimer (u. a.) |
Erscheinungsdatum: | 19.11.2010 |
Gewicht: | 0,904 kg |
Zusammenfassung
This classic monograph again available in a revised and updated
version by the author's successor.
version by the author's successor.
Inhaltsverzeichnis
Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron¿Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ..- Imaging of Crystalline Specimens and Their Defects..- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy..- Specimen Damage by Electron Irradiation.
Details
Erscheinungsjahr: | 2010 |
---|---|
Genre: | Importe, Technik allg. |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Taschenbuch |
Inhalt: |
xvi
590 S. 276 s/w Illustr. 590 p. 276 illus. |
ISBN-13: | 9781441923080 |
ISBN-10: | 144192308X |
Sprache: | Englisch |
Einband: | Kartoniert / Broschiert |
Autor: |
Reimer, Ludwig
Kohl, Helmut |
Auflage: | 5th edition |
Hersteller: |
Springer US
Springer New York |
Verantwortliche Person für die EU: | Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com |
Maße: | 236 x 154 x 35 mm |
Von/Mit: | Ludwig Reimer (u. a.) |
Erscheinungsdatum: | 19.11.2010 |
Gewicht: | 0,904 kg |
Sicherheitshinweis