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X-Ray Diffraction for Materials Research
From Fundamentals to Applications
Taschenbuch von Myeongkyu Lee
Sprache: Englisch

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Beschreibung

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how

Über den Autor
Lee, Myeongkyu||
Inhaltsverzeichnis

X-Rays and Crystal Geometry. Electromagnetic Waves and X-Rays. Geometry of Crystals. Interference and Diffraction. Theory of X-Ray Diffraction. Directions of X-Ray Diffraction. Intensities of X-Ray Diffraction. Applications of X-Ray Diffraction. Characterization of Thin Films by X-Ray Diffraction. Laue Method And Determination of Single Crystal Orientation. Powder Diffraction. Index.

Details
Erscheinungsjahr: 2021
Fachbereich: Technik allgemein
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Inhalt: Einband - flex.(Paperback)
ISBN-13: 9781774635933
ISBN-10: 1774635933
Sprache: Englisch
Einband: Kartoniert / Broschiert
Autor: Lee, Myeongkyu
Hersteller: Apple Academic Press Inc.
Maße: 150 x 228 x 19 mm
Von/Mit: Myeongkyu Lee
Erscheinungsdatum: 31.03.2021
Gewicht: 0,45 kg
Artikel-ID: 127260796
Über den Autor
Lee, Myeongkyu||
Inhaltsverzeichnis

X-Rays and Crystal Geometry. Electromagnetic Waves and X-Rays. Geometry of Crystals. Interference and Diffraction. Theory of X-Ray Diffraction. Directions of X-Ray Diffraction. Intensities of X-Ray Diffraction. Applications of X-Ray Diffraction. Characterization of Thin Films by X-Ray Diffraction. Laue Method And Determination of Single Crystal Orientation. Powder Diffraction. Index.

Details
Erscheinungsjahr: 2021
Fachbereich: Technik allgemein
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Inhalt: Einband - flex.(Paperback)
ISBN-13: 9781774635933
ISBN-10: 1774635933
Sprache: Englisch
Einband: Kartoniert / Broschiert
Autor: Lee, Myeongkyu
Hersteller: Apple Academic Press Inc.
Maße: 150 x 228 x 19 mm
Von/Mit: Myeongkyu Lee
Erscheinungsdatum: 31.03.2021
Gewicht: 0,45 kg
Artikel-ID: 127260796
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