Advanced Computing in Electron Microscopy

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Sprache: Englisch

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Beschreibung

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Über den Autor

Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell.

Zusammenfassung

Features in-depth coverage of numerical computation of electron microscopy images including multislice methods

Covers high resolution CTEM and STEM image interpretation

Addresses the latest developments in the field from the last decade

Includes updated appendices with code in Octave

Allows you to calculate images from first principles for specimens ranging from simple inorganic crystals to cryo-EM biological specimens

Inhaltsverzeichnis

Introduction.- The Transmission Electron Microscope.- Some Image Approximations.- Sampling and the Fast Fourier Transform.- Calculation of Images of Thin Specimens.- Theory of Calculation of Images of Thick Specimens.- Multislice Applications and Examples.- The Programss.- App. A: Plotting Transfer Functions.- App. B: The Fourier Projection Theorem.- App. C: Atomic Potentials and Scattering Factors.- App. D: The Inverse Problem.- App. E: Bilinear Interpolation.- App. F: 3D Perspective View.

Details

Erscheinungsjahr:	2020
Fachbereich:	Physikalische Chemie
Genre:	Chemie , Mathematik , Medizin , Naturwissenschaften , Technik
Rubrik:	Naturwissenschaften & Technik
Medium:	Buch
Inhalt:	xii 354 S. 138 s/w Illustr. 8 farbige Illustr. 354 p. 146 illus. 8 illus. in color.
ISBN-13:	9783030332594
ISBN-10:	3030332594
Sprache:	Englisch
Einband:	Gebunden
Autor:	Kirkland, Earl J.
Auflage:	Third Edition 2020
Hersteller:	Springer Nature Switzerland Springer International Publishing Springer International Publishing AG
Verantwortliche Person für die EU:	Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße:	241 x 160 x 26 mm
Von/Mit:	Earl J. Kirkland
Erscheinungsdatum:	10.03.2020
Gewicht:	0,717 kg

Artikel-ID: 117435279