Felix A. Levinzon received the M.S. degree in radio engineering from the Taganrog Radio Engineering Institute, Taganrog, Russia, in 1961 and the Ph.D. degree in electronic engineering from the National Research Institute for Physical, Technical and Radio-Technical Measurements (VNIIFTRI), Moscow, Russia, in 1974.

He was a Designer and Research Engineer with the VNIIFTRI from 1965 to 1993 in the field of low-noise electronics. In 1993 he emigrated to the USA. From 1996 up to now he is a Principal Engineer with Meggitt - Orange County (formerly Endevco Corp.), Irvine, CA, USA. Dr. Levinzon is the author or coauthor more than 50 publications in scientific journals and international conference proceedings and holds nine patents. He is a member of the Institute of Electrical and Electronics Engineers (IEEE). His main field of interest and expertise is design electronics for vibration sensors, electronics for piezoelectric accelerometers including low-noise, high temperature and miniature analog electronics.

Provides a comprehensive reference to the design and performance of IEPE accelerometers, including low-noise and high temperature IEPE sensors

Includes noise analysis of the IEPE accelerometer, which enables estimation of the its noise floor and noise limits

Describes recently design of ultra-low-noise (at level of 3 ng/vHz) IEPE seismic accelerometers and high temperature (up to 175 °C) triaxial and single axis miniature IEPE accelerometers

Compares low-frequency noise in different JFETs and MOSFETs including measurement results of ultra-low-noise (at level of 0.6 nV/vHz) JFET

Presents key factors for design of low-noise and high temperature IEPE accelerometer and their electronics

Includes supplementary material: [...]

Introduction to Piezoelectric Accelerometers with Integral Electronics.- Piezoelectric Transducers Used for Piezoelectric Accelerometers with Integral Electronics.- Integral FET Amplifiers Used for IEPE Accelerometers.- Noise of a FET Amplifier.- Comparison of 1/f Noise and Thermal Noise in JFETs and MOSFETs.- Fundamental Noise Limit of an IEPE Accelerometer.- Noise of and IEPE Accelerometer.- Ultra-low-noise IEPE Seismic Accelerometers.- High-temperature, up to
175 º
C, Miniature IEPE Accelerometers.